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Microstructural parameters obtained from the Rietveld refinement of the diffraction patterns recorded using <t> XRD </t> and <t> NPD. </t>
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Image Search Results


Microstructural parameters obtained from the Rietveld refinement of the diffraction patterns recorded using  XRD  and  NPD.

Journal: Materials

Article Title: Unveiling the Hidden Entropy in ZnFe 2 O 4

doi: 10.3390/ma15031198

Figure Lengend Snippet: Microstructural parameters obtained from the Rietveld refinement of the diffraction patterns recorded using XRD and NPD.

Article Snippet: The obtained XRD and NPD patterns were analyzed using TOPAS v6.0 (Bruker AXDS, GmbH, Karlsruhe, Germany).

Techniques: